ML Anthology

ARC: Adversarial Robust Cuts for Semi-Supervised and Multi-Label Classification

Sima Behpour, Wei Xing, Brian D. Ziebart
AAAI 2018 pp. 2704-2711
doi:10.1609/AAAI.V32I1.11817 /aaai/2018/behpour2018aaai-arc/
AAAI Semantic Scholar

Cite

Text

Behpour et al. "ARC: Adversarial Robust Cuts for Semi-Supervised and Multi-Label Classification." AAAI Conference on Artificial Intelligence, 2018. doi:10.1609/AAAI.V32I1.11817

Markdown

[Behpour et al. "ARC: Adversarial Robust Cuts for Semi-Supervised and Multi-Label Classification." AAAI Conference on Artificial Intelligence, 2018.](https://mlanthology.org/aaai/2018/behpour2018aaai-arc/) doi:10.1609/AAAI.V32I1.11817

BibTeX

@inproceedings{behpour2018aaai-arc,
  title     = {{ARC: Adversarial Robust Cuts for Semi-Supervised and Multi-Label Classification}},
  author    = {Behpour, Sima and Xing, Wei and Ziebart, Brian D.},
  booktitle = {AAAI Conference on Artificial Intelligence},
  year      = {2018},
  pages     = {2704-2711},
  doi       = {10.1609/AAAI.V32I1.11817},
  url       = {https://mlanthology.org/aaai/2018/behpour2018aaai-arc/}
}