Key Feature Replacement of In-Distribution Samples for Out-of-Distribution Detection

Kim et al. "Key Feature Replacement of In-Distribution Samples for Out-of-Distribution Detection." AAAI Conference on Artificial Intelligence, 2023. doi:10.1609/AAAI.V37I7.25995

[Kim et al. "Key Feature Replacement of In-Distribution Samples for Out-of-Distribution Detection." AAAI Conference on Artificial Intelligence, 2023.](https://mlanthology.org/aaai/2023/kim2023aaai-key/) doi:10.1609/AAAI.V37I7.25995

@inproceedings{kim2023aaai-key,
  title     = {{Key Feature Replacement of In-Distribution Samples for Out-of-Distribution Detection}},
  author    = {Kim, Jaeyoung and Kong, Seo Taek and Na, Dongbin and Jung, Kyu-Hwan},
  booktitle = {AAAI Conference on Artificial Intelligence},
  year      = {2023},
  pages     = {8246-8254},
  doi       = {10.1609/AAAI.V37I7.25995},
  url       = {https://mlanthology.org/aaai/2023/kim2023aaai-key/}
}