Key Feature Replacement of In-Distribution Samples for Out-of-Distribution Detection
Abstract
Out-of-distribution (OOD) detection can be used in deep learning-based applications to reject outlier samples from being unreliably classified by deep neural networks. Learning to classify between OOD and in-distribution samples is difficult because data comprising the former is extremely diverse. It has been observed that an auxiliary OOD dataset is most effective in training a ``rejection'' network when its samples are semantically similar to in-distribution images. We first deduce that OOD images are perceived by a deep neural network to be semantically similar to in-distribution samples when they share a common background, as deep networks are observed to incorrectly classify such images with high confidence. We then propose a simple yet effective Key In-distribution feature Replacement BY inpainting (KIRBY) procedure that constructs a surrogate OOD dataset by replacing class-discriminative features of in-distribution samples with marginal background features. The procedure can be implemented using off-the-shelf vision algorithms, where each step within the algorithm is shown to make the surrogate data increasingly similar to in-distribution data. Design choices in each step are studied extensively, and an exhaustive comparison with state-of-the-art algorithms demonstrates KIRBY's competitiveness on various benchmarks.
Cite
Text
Kim et al. "Key Feature Replacement of In-Distribution Samples for Out-of-Distribution Detection." AAAI Conference on Artificial Intelligence, 2023. doi:10.1609/AAAI.V37I7.25995Markdown
[Kim et al. "Key Feature Replacement of In-Distribution Samples for Out-of-Distribution Detection." AAAI Conference on Artificial Intelligence, 2023.](https://mlanthology.org/aaai/2023/kim2023aaai-key/) doi:10.1609/AAAI.V37I7.25995BibTeX
@inproceedings{kim2023aaai-key,
title = {{Key Feature Replacement of In-Distribution Samples for Out-of-Distribution Detection}},
author = {Kim, Jaeyoung and Kong, Seo Taek and Na, Dongbin and Jung, Kyu-Hwan},
booktitle = {AAAI Conference on Artificial Intelligence},
year = {2023},
pages = {8246-8254},
doi = {10.1609/AAAI.V37I7.25995},
url = {https://mlanthology.org/aaai/2023/kim2023aaai-key/}
}