ML Anthology

ITP: Instance-Aware Test Pruning for Out-of-Distribution Detection

Haonan Xu, Yang Yang
AAAI 2025 pp. 21743-21751
doi:10.1609/AAAI.V39I20.35479 /aaai/2025/xu2025aaai-itp/
AAAI Semantic Scholar

Cite

Text

Xu and Yang. "ITP: Instance-Aware Test Pruning for Out-of-Distribution Detection." AAAI Conference on Artificial Intelligence, 2025. doi:10.1609/AAAI.V39I20.35479

Markdown

[Xu and Yang. "ITP: Instance-Aware Test Pruning for Out-of-Distribution Detection." AAAI Conference on Artificial Intelligence, 2025.](https://mlanthology.org/aaai/2025/xu2025aaai-itp/) doi:10.1609/AAAI.V39I20.35479

BibTeX

@inproceedings{xu2025aaai-itp,
  title     = {{ITP: Instance-Aware Test Pruning for Out-of-Distribution Detection}},
  author    = {Xu, Haonan and Yang, Yang},
  booktitle = {AAAI Conference on Artificial Intelligence},
  year      = {2025},
  pages     = {21743-21751},
  doi       = {10.1609/AAAI.V39I20.35479},
  url       = {https://mlanthology.org/aaai/2025/xu2025aaai-itp/}
}