Saeys, Yvan

10 publications

MLJ 2024 Evaluating Feature Attribution Methods in the Image Domain Arne Gevaert, Axel-Jan Rousseau, Thijs Becker, Dirk Valkenborg, Tijl De Bie, Yvan Saeys

ECML-PKDD 2024 Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE Edith Heiter, Liesbet Martens, Ruth Seurinck, Martin Guilliams, Tijl De Bie, Yvan Saeys, Jefrey Lijffijt

AISTATS 2022 The Curse Revisited: When Are Distances Informative for the Ground Truth in Noisy High-Dimensional Data? Robin Vandaele, Bo Kang, Tijl De Bie, Yvan Saeys

ICLR 2022 Topologically Regularized Data Embeddings Robin Vandaele, Bo Kang, Jefrey Lijffijt, Tijl De Bie, Yvan Saeys

JMLR 2020 Mining Topological Structure in Graphs Through Forest Representations Robin Vandaele, Yvan Saeys, Tijl De Bie

ECML-PKDD 2018 Local Topological Data Analysis to Uncover the Global Structure of Data Approaching Graph-Structured Topologies Robin Vandaele, Tijl De Bie, Yvan Saeys

NeurIPS 2017 Lower Bounds on the Robustness to Adversarial Perturbations Jonathan Peck, Joris Roels, Bart Goossens, Yvan Saeys

ECML-PKDD 2016 Machine Learning Challenges for Single Cell Data Sofie Van Gassen, Tom Dhaene, Yvan Saeys

MLOSS 2009 Java-ML: A Machine Learning Library Thomas Abeel, Yves Van de Peer, Yvan Saeys

ECML-PKDD 2008 Robust Feature Selection Using Ensemble Feature Selection Techniques Yvan Saeys, Thomas Abeel, Yves Van de Peer