ML Anthology

Acquiring Simple Patterns for Surface Inspection

Joseph H. Nurre, Ernest L. Hall, Juha Röning
CVPR 1988 pp. 586-591
doi:10.1109/CVPR.1988.196295 /cvpr/1988/nurre1988cvpr-acquiring/

Abstract

The application of computer-integrated engineering to machine vision for the goal of inspecting manufactured parts is considered. One of the most practical vision methods for making measurements on a smooth manufactured part is single-image stereo, which makes use of a structured light source and a single camera. The problem of analyzing the light reflected from the work piece can be simplified by tailoring the light source to the workpiece. By specifying the reflective pattern to be parallel straight lines, it is possible to determine the resolution of such a system. Distortions in the straight, parallel lines reflected by the surface can be quantified in terms of depth of flaw in the part.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

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Cite

Text

Nurre et al. "Acquiring Simple Patterns for Surface Inspection." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1988. doi:10.1109/CVPR.1988.196295

Markdown

[Nurre et al. "Acquiring Simple Patterns for Surface Inspection." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1988.](https://mlanthology.org/cvpr/1988/nurre1988cvpr-acquiring/) doi:10.1109/CVPR.1988.196295

BibTeX

@inproceedings{nurre1988cvpr-acquiring,
  title     = {{Acquiring Simple Patterns for Surface Inspection}},
  author    = {Nurre, Joseph H. and Hall, Ernest L. and Röning, Juha},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {1988},
  pages     = {586-591},
  doi       = {10.1109/CVPR.1988.196295},
  url       = {https://mlanthology.org/cvpr/1988/nurre1988cvpr-acquiring/}
}