On Image Analysis by the Methods of Moments
Abstract
Various types of moments have been used to recognize image patterns in a number of applications. The authors evaluate a number of moments and addresses some fundamental questions, such as image representation ability, noise sensitivity, and information redundancy. Moments considered include regular moments, Legendre moments, Zernike moments, pseudo-Zernike moments, rotational moments and complex moments. Properties of these moments are examined in detail, and the interrelationships among them are discussed. Both theoretical and experimental results are presented.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
Cite
Text
Teh and Chin. "On Image Analysis by the Methods of Moments." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1988. doi:10.1109/CVPR.1988.196290Markdown
[Teh and Chin. "On Image Analysis by the Methods of Moments." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1988.](https://mlanthology.org/cvpr/1988/teh1988cvpr-image/) doi:10.1109/CVPR.1988.196290BibTeX
@inproceedings{teh1988cvpr-image,
title = {{On Image Analysis by the Methods of Moments}},
author = {Teh, Cho-Huak and Chin, Roland T.},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
year = {1988},
pages = {556-561},
doi = {10.1109/CVPR.1988.196290},
url = {https://mlanthology.org/cvpr/1988/teh1988cvpr-image/}
}