A Cost Minimization Approach to Edge Detection Using Simulated Annealing
Abstract
Edge detection is analyzed as a problem in cost minimization. A cost function is formulated that evaluates the quality of edge configurations. A mathematical description of edges is given, and the cost function is analyzed in terms of the characteristics of the edges in minimum-cost configurations. The cost function is minimized by the simulated annealing method. A novel set of strategies for generating candidate states and a suitable temperature schedule are presented. Sequential and parallel versions of the annealing algorithm are implemented and compared. Experimental results are presented.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
Cite
Text
Tan et al. "A Cost Minimization Approach to Edge Detection Using Simulated Annealing." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1989. doi:10.1109/CVPR.1989.37832Markdown
[Tan et al. "A Cost Minimization Approach to Edge Detection Using Simulated Annealing." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1989.](https://mlanthology.org/cvpr/1989/tan1989cvpr-cost/) doi:10.1109/CVPR.1989.37832BibTeX
@inproceedings{tan1989cvpr-cost,
title = {{A Cost Minimization Approach to Edge Detection Using Simulated Annealing}},
author = {Tan, Hin Leong and Gelfand, Saul B. and Delp, Edward J.},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
year = {1989},
pages = {86-91},
doi = {10.1109/CVPR.1989.37832},
url = {https://mlanthology.org/cvpr/1989/tan1989cvpr-cost/}
}