Parameter Estimation in MRF Line Process Models

Nadabar, Sateesha G.; Jain, Anil K.

doi:10.1109/CVPR.1992.223140

Parameter Estimation in MRF Line Process Models

Sateesha G. Nadabar, Anil K. Jain

CVPR 1992 pp. 528-533

doi:10.1109/CVPR.1992.223140 /cvpr/1992/nadabar1992cvpr-parameter/

Abstract

A scheme for the estimation of the Markov random field (MRF) line process parameters that uses geometric CAD models of the objects in the scene is presented. The models are used to generate synthetic images of the objects from random viewpoints. The edge maps computed from the synthesized images are used as training samples to estimate the line process parameters using a least squares method. It is shown that this parameter estimation method is useful for detecting edges in range as well as intensity images.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>

CVPR Semantic Scholar

Cite

Text

Nadabar and Jain. "Parameter Estimation in MRF Line Process Models." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1992. doi:10.1109/CVPR.1992.223140

Markdown

[Nadabar and Jain. "Parameter Estimation in MRF Line Process Models." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1992.](https://mlanthology.org/cvpr/1992/nadabar1992cvpr-parameter/) doi:10.1109/CVPR.1992.223140

BibTeX

@inproceedings{nadabar1992cvpr-parameter,
  title     = {{Parameter Estimation in MRF Line Process Models}},
  author    = {Nadabar, Sateesha G. and Jain, Anil K.},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {1992},
  pages     = {528-533},
  doi       = {10.1109/CVPR.1992.223140},
  url       = {https://mlanthology.org/cvpr/1992/nadabar1992cvpr-parameter/}
}