ML Anthology

Robust Statistics in Shape Fitting

Andrew Stein, Michael Werman
CVPR 1992 pp. 540-546
doi:10.1109/CVPR.1992.223138 /cvpr/1992/stein1992cvpr-robust/

Abstract

The concept of robustness in statistics is examined. Starting from the concepts of the breakdown point and equivariance properties of an estimator, the desired equivariance properties for shape fitting are defined, and high breakdown point methods with these properties are found.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

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Cite

Text

Stein and Werman. "Robust Statistics in Shape Fitting." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1992. doi:10.1109/CVPR.1992.223138

Markdown

[Stein and Werman. "Robust Statistics in Shape Fitting." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1992.](https://mlanthology.org/cvpr/1992/stein1992cvpr-robust/) doi:10.1109/CVPR.1992.223138

BibTeX

@inproceedings{stein1992cvpr-robust,
  title     = {{Robust Statistics in Shape Fitting}},
  author    = {Stein, Andrew and Werman, Michael},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {1992},
  pages     = {540-546},
  doi       = {10.1109/CVPR.1992.223138},
  url       = {https://mlanthology.org/cvpr/1992/stein1992cvpr-robust/}
}