ML Anthology

Eigenfeatures for Planar Pose Measurement of Partially Occluded Objects

John Krumm
CVPR 1996 pp. 55-60
doi:10.1109/CVPR.1996.517053 /cvpr/1996/krumm1996cvpr-eigenfeatures/
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Cite

Text

Krumm. "Eigenfeatures for Planar Pose Measurement of Partially Occluded Objects." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1996. doi:10.1109/CVPR.1996.517053

Markdown

[Krumm. "Eigenfeatures for Planar Pose Measurement of Partially Occluded Objects." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1996.](https://mlanthology.org/cvpr/1996/krumm1996cvpr-eigenfeatures/) doi:10.1109/CVPR.1996.517053

BibTeX

@inproceedings{krumm1996cvpr-eigenfeatures,
  title     = {{Eigenfeatures for Planar Pose Measurement of Partially Occluded Objects}},
  author    = {Krumm, John},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {1996},
  pages     = {55-60},
  doi       = {10.1109/CVPR.1996.517053},
  url       = {https://mlanthology.org/cvpr/1996/krumm1996cvpr-eigenfeatures/}
}