Miller and Stewart. "MUSE: Robust Surface Fitting Using Unbiased Scale Estimates." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1996. doi:10.1109/CVPR.1996.517089
Markdown
[Miller and Stewart. "MUSE: Robust Surface Fitting Using Unbiased Scale Estimates." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1996.](https://mlanthology.org/cvpr/1996/miller1996cvpr-muse/) doi:10.1109/CVPR.1996.517089
BibTeX
@inproceedings{miller1996cvpr-muse,
title = {{MUSE: Robust Surface Fitting Using Unbiased Scale Estimates}},
author = {Miller, James V. and Stewart, Charles V.},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
year = {1996},
pages = {300-306},
doi = {10.1109/CVPR.1996.517089},
url = {https://mlanthology.org/cvpr/1996/miller1996cvpr-muse/}
}