ML Anthology

Exhaustive Detection of Manufacturing Flaws as Abnormalities

Van-Duc Nguyen, J. Alison Noble, Joseph L. Mundy, John Janning, Joseph Ross
CVPR 1998 pp. 945-952
doi:10.1109/CVPR.1998.698718 /cvpr/1998/nguyen1998cvpr-exhaustive/
CVPR Semantic Scholar

Cite

Text

Nguyen et al. "Exhaustive Detection of Manufacturing Flaws as Abnormalities." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1998. doi:10.1109/CVPR.1998.698718

Markdown

[Nguyen et al. "Exhaustive Detection of Manufacturing Flaws as Abnormalities." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1998.](https://mlanthology.org/cvpr/1998/nguyen1998cvpr-exhaustive/) doi:10.1109/CVPR.1998.698718

BibTeX

@inproceedings{nguyen1998cvpr-exhaustive,
  title     = {{Exhaustive Detection of Manufacturing Flaws as Abnormalities}},
  author    = {Nguyen, Van-Duc and Noble, J. Alison and Mundy, Joseph L. and Janning, John and Ross, Joseph},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {1998},
  pages     = {945-952},
  doi       = {10.1109/CVPR.1998.698718},
  url       = {https://mlanthology.org/cvpr/1998/nguyen1998cvpr-exhaustive/}
}