ML Anthology

Measurement of Surface Orientations of Transparent Objects Using Polarization in Highlight

Megumi Saito, Hiroshi Kashiwagi, Yoichi Sato, Katsushi Ikeuchi
CVPR 1999 pp. 1381-
doi:10.1109/CVPR.1999.786967 /cvpr/1999/saito1999cvpr-measurement/

Abstract

This paper proposes a method for obtaining surface orientations of transparent objects using polarization in highlight. Since the highlight, the specular component of reflection light from objects, is observed only near the specular direction, it appears merely on limited parts on an object surface. In order to obtain orientations of a whole object surface, we employ a spherical extended light source. This paper reports its experimental apparatus, a shape recovery algorithm, and its performance evaluation.

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Text

Saito et al. "Measurement of Surface Orientations of Transparent Objects Using Polarization in Highlight." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1999. doi:10.1109/CVPR.1999.786967

Markdown

[Saito et al. "Measurement of Surface Orientations of Transparent Objects Using Polarization in Highlight." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1999.](https://mlanthology.org/cvpr/1999/saito1999cvpr-measurement/) doi:10.1109/CVPR.1999.786967

BibTeX

@inproceedings{saito1999cvpr-measurement,
  title     = {{Measurement of Surface Orientations of Transparent Objects Using Polarization in Highlight}},
  author    = {Saito, Megumi and Kashiwagi, Hiroshi and Sato, Yoichi and Ikeuchi, Katsushi},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {1999},
  pages     = {1381-},
  doi       = {10.1109/CVPR.1999.786967},
  url       = {https://mlanthology.org/cvpr/1999/saito1999cvpr-measurement/}
}