A Novel Bayesian Method for Fitting Parametric and Non-Parametric Models to Noisy Data

CVPR 1999 pp. 2552-2558

doi:10.1109/CVPR.1999.784964 /cvpr/1999/werman1999cvpr-novel/

Cite

Text

Werman and Keren. "A Novel Bayesian Method for Fitting Parametric and Non-Parametric Models to Noisy Data." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1999. doi:10.1109/CVPR.1999.784964

Markdown

[Werman and Keren. "A Novel Bayesian Method for Fitting Parametric and Non-Parametric Models to Noisy Data." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 1999.](https://mlanthology.org/cvpr/1999/werman1999cvpr-novel/) doi:10.1109/CVPR.1999.784964

BibTeX

@inproceedings{werman1999cvpr-novel,
  title     = {{A Novel Bayesian Method for Fitting Parametric and Non-Parametric Models to Noisy Data}},
  author    = {Werman, Michael and Keren, Daniel},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {1999},
  pages     = {2552-2558},
  doi       = {10.1109/CVPR.1999.784964},
  url       = {https://mlanthology.org/cvpr/1999/werman1999cvpr-novel/}
}