ML Anthology

On Measuring Low-Level Saliency in Photographic Images

Jiebo Luo, Amit Singhal
CVPR 2000 pp. 1084-1089
doi:10.1109/CVPR.2000.855803 /cvpr/2000/luo2000cvpr-measuring/
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Cite

Text

Luo and Singhal. "On Measuring Low-Level Saliency in Photographic Images." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2000. doi:10.1109/CVPR.2000.855803

Markdown

[Luo and Singhal. "On Measuring Low-Level Saliency in Photographic Images." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2000.](https://mlanthology.org/cvpr/2000/luo2000cvpr-measuring/) doi:10.1109/CVPR.2000.855803

BibTeX

@inproceedings{luo2000cvpr-measuring,
  title     = {{On Measuring Low-Level Saliency in Photographic Images}},
  author    = {Luo, Jiebo and Singhal, Amit},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {2000},
  pages     = {1084-1089},
  doi       = {10.1109/CVPR.2000.855803},
  url       = {https://mlanthology.org/cvpr/2000/luo2000cvpr-measuring/}
}