ML Anthology

Order Parameters for Minimax Entropy Distributions: When Does High Level Knowledge Help?

Alan L. Yuille, James M. Coughlan, Song Chun Zhu, Ying Nian Wu
CVPR 2000 pp. 1558-1565
doi:10.1109/CVPR.2000.855869 /cvpr/2000/yuille2000cvpr-order/
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Cite

Text

Yuille et al. "Order Parameters for Minimax Entropy Distributions: When Does High Level Knowledge Help?." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2000. doi:10.1109/CVPR.2000.855869

Markdown

[Yuille et al. "Order Parameters for Minimax Entropy Distributions: When Does High Level Knowledge Help?." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2000.](https://mlanthology.org/cvpr/2000/yuille2000cvpr-order/) doi:10.1109/CVPR.2000.855869

BibTeX

@inproceedings{yuille2000cvpr-order,
  title     = {{Order Parameters for Minimax Entropy Distributions: When Does High Level Knowledge Help?}},
  author    = {Yuille, Alan L. and Coughlan, James M. and Zhu, Song Chun and Wu, Ying Nian},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {2000},
  pages     = {1558-1565},
  doi       = {10.1109/CVPR.2000.855869},
  url       = {https://mlanthology.org/cvpr/2000/yuille2000cvpr-order/}
}