Face Alignment Using Statistical Models and Wavelet Features

Cite

Text

Jiao et al. "Face Alignment Using Statistical Models and Wavelet Features." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2003. doi:10.1109/CVPR.2003.1211370

Markdown

[Jiao et al. "Face Alignment Using Statistical Models and Wavelet Features." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2003.](https://mlanthology.org/cvpr/2003/jiao2003cvpr-face/) doi:10.1109/CVPR.2003.1211370

BibTeX

@inproceedings{jiao2003cvpr-face,
  title     = {{Face Alignment Using Statistical Models and Wavelet Features}},
  author    = {Jiao, Feng and Li, Stan Z. and Shum, Heung-Yeung and Schuurmans, Dale},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {2003},
  pages     = {321-327},
  doi       = {10.1109/CVPR.2003.1211370},
  url       = {https://mlanthology.org/cvpr/2003/jiao2003cvpr-face/}
}