Jiao et al. "Face Alignment Using Statistical Models and Wavelet Features." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2003. doi:10.1109/CVPR.2003.1211370
Markdown
[Jiao et al. "Face Alignment Using Statistical Models and Wavelet Features." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2003.](https://mlanthology.org/cvpr/2003/jiao2003cvpr-face/) doi:10.1109/CVPR.2003.1211370
BibTeX
@inproceedings{jiao2003cvpr-face,
title = {{Face Alignment Using Statistical Models and Wavelet Features}},
author = {Jiao, Feng and Li, Stan Z. and Shum, Heung-Yeung and Schuurmans, Dale},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
year = {2003},
pages = {321-327},
doi = {10.1109/CVPR.2003.1211370},
url = {https://mlanthology.org/cvpr/2003/jiao2003cvpr-face/}
}