Learning a Similarity Metric Discriminatively, with Application to Face Verification

Chopra et al. "Learning a Similarity Metric Discriminatively, with Application to Face Verification." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2005. doi:10.1109/CVPR.2005.202

[Chopra et al. "Learning a Similarity Metric Discriminatively, with Application to Face Verification." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2005.](https://mlanthology.org/cvpr/2005/chopra2005cvpr-learning/) doi:10.1109/CVPR.2005.202

@inproceedings{chopra2005cvpr-learning,
  title     = {{Learning a Similarity Metric Discriminatively, with Application to Face Verification}},
  author    = {Chopra, Sumit and Hadsell, Raia and LeCun, Yann},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {2005},
  pages     = {539-546},
  doi       = {10.1109/CVPR.2005.202},
  url       = {https://mlanthology.org/cvpr/2005/chopra2005cvpr-learning/}
}