ML Anthology

Learning Non-Metric Partial Similarity Based on Maximal Margin Criterion

Xiaoyang Tan, Songcan Chen, Jun Li, Zhi-Hua Zhou
CVPR 2006 pp. 138-145
doi:10.1109/CVPR.2006.170 /cvpr/2006/tan2006cvpr-learning/
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Cite

Text

Tan et al. "Learning Non-Metric Partial Similarity Based on Maximal Margin Criterion." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2006. doi:10.1109/CVPR.2006.170

Markdown

[Tan et al. "Learning Non-Metric Partial Similarity Based on Maximal Margin Criterion." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2006.](https://mlanthology.org/cvpr/2006/tan2006cvpr-learning/) doi:10.1109/CVPR.2006.170

BibTeX

@inproceedings{tan2006cvpr-learning,
  title     = {{Learning Non-Metric Partial Similarity Based on Maximal Margin Criterion}},
  author    = {Tan, Xiaoyang and Chen, Songcan and Li, Jun and Zhou, Zhi-Hua},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {2006},
  pages     = {138-145},
  doi       = {10.1109/CVPR.2006.170},
  url       = {https://mlanthology.org/cvpr/2006/tan2006cvpr-learning/}
}