ML Anthology

The Logistic Random Field - A Convenient Graphical Model for Learning Parameters for MRF-Based Labeling

Marshall F. Tappen, Kegan G. G. Samuel, Craig V. Dean, David M. Lyle
CVPR 2008
doi:10.1109/CVPR.2008.4587669 /cvpr/2008/tappen2008cvpr-logistic/
CVPR Semantic Scholar

Cite

Text

Tappen et al. "The Logistic Random Field - A Convenient Graphical Model for Learning Parameters for MRF-Based Labeling." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2008. doi:10.1109/CVPR.2008.4587669

Markdown

[Tappen et al. "The Logistic Random Field - A Convenient Graphical Model for Learning Parameters for MRF-Based Labeling." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2008.](https://mlanthology.org/cvpr/2008/tappen2008cvpr-logistic/) doi:10.1109/CVPR.2008.4587669

BibTeX

@inproceedings{tappen2008cvpr-logistic,
  title     = {{The Logistic Random Field - A Convenient Graphical Model for Learning Parameters for MRF-Based Labeling}},
  author    = {Tappen, Marshall F. and Samuel, Kegan G. G. and Dean, Craig V. and Lyle, David M.},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {2008},
  doi       = {10.1109/CVPR.2008.4587669},
  url       = {https://mlanthology.org/cvpr/2008/tappen2008cvpr-logistic/}
}