Toews and Iii. "SIFT-Rank: Ordinal Description for Invariant Feature Correspondence." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2009. doi:10.1109/CVPR.2009.5206849
Markdown
[Toews and Iii. "SIFT-Rank: Ordinal Description for Invariant Feature Correspondence." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2009.](https://mlanthology.org/cvpr/2009/toews2009cvpr-sift/) doi:10.1109/CVPR.2009.5206849
BibTeX
@inproceedings{toews2009cvpr-sift,
title = {{SIFT-Rank: Ordinal Description for Invariant Feature Correspondence}},
author = {Toews, Matthew and Iii, William M. Wells},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
year = {2009},
pages = {172-177},
doi = {10.1109/CVPR.2009.5206849},
url = {https://mlanthology.org/cvpr/2009/toews2009cvpr-sift/}
}