Wachinger and Navab. "Similarity Metrics and Efficient Optimization for Simultaneous Registration." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2009. doi:10.1109/CVPR.2009.5206694
Markdown
[Wachinger and Navab. "Similarity Metrics and Efficient Optimization for Simultaneous Registration." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2009.](https://mlanthology.org/cvpr/2009/wachinger2009cvpr-similarity/) doi:10.1109/CVPR.2009.5206694
BibTeX
@inproceedings{wachinger2009cvpr-similarity,
title = {{Similarity Metrics and Efficient Optimization for Simultaneous Registration}},
author = {Wachinger, Christian and Navab, Nassir},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
year = {2009},
pages = {667-674},
doi = {10.1109/CVPR.2009.5206694},
url = {https://mlanthology.org/cvpr/2009/wachinger2009cvpr-similarity/}
}