Similarity Metrics and Efficient Optimization for Simultaneous Registration

Cite

Text

Wachinger and Navab. "Similarity Metrics and Efficient Optimization for Simultaneous Registration." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2009. doi:10.1109/CVPR.2009.5206694

Markdown

[Wachinger and Navab. "Similarity Metrics and Efficient Optimization for Simultaneous Registration." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2009.](https://mlanthology.org/cvpr/2009/wachinger2009cvpr-similarity/) doi:10.1109/CVPR.2009.5206694

BibTeX

@inproceedings{wachinger2009cvpr-similarity,
  title     = {{Similarity Metrics and Efficient Optimization for Simultaneous Registration}},
  author    = {Wachinger, Christian and Navab, Nassir},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {2009},
  pages     = {667-674},
  doi       = {10.1109/CVPR.2009.5206694},
  url       = {https://mlanthology.org/cvpr/2009/wachinger2009cvpr-similarity/}
}