Increasing Depth Resolution of Electron Microscopy of Neural Circuits Using Sparse Tomographic Reconstruction

Cite

Text

Veeraraghavan et al. "Increasing Depth Resolution of Electron Microscopy of Neural Circuits Using Sparse Tomographic Reconstruction." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2010. doi:10.1109/CVPR.2010.5539846

Markdown

[Veeraraghavan et al. "Increasing Depth Resolution of Electron Microscopy of Neural Circuits Using Sparse Tomographic Reconstruction." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2010.](https://mlanthology.org/cvpr/2010/veeraraghavan2010cvpr-increasing/) doi:10.1109/CVPR.2010.5539846

BibTeX

@inproceedings{veeraraghavan2010cvpr-increasing,
  title     = {{Increasing Depth Resolution of Electron Microscopy of Neural Circuits Using Sparse Tomographic Reconstruction}},
  author    = {Veeraraghavan, Ashok and Genkin, Alex V. and Vitaladevuni, Shiv Naga Prasad and Scheffer, Lou and Xu, Shan and Hess, Harald F. and Fetter, Richard and Cantoni, Marco and Knott, Graham and Chklovskii, Dmitri B.},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {2010},
  pages     = {1767-1774},
  doi       = {10.1109/CVPR.2010.5539846},
  url       = {https://mlanthology.org/cvpr/2010/veeraraghavan2010cvpr-increasing/}
}