ML Anthology

Discovering Localized Attributes for Fine-Grained Recognition

Kun Duan, Devi Parikh, David J. Crandall, Kristen Grauman
CVPR 2012 pp. 3474-3481
doi:10.1109/CVPR.2012.6248089 /cvpr/2012/duan2012cvpr-discovering/
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Cite

Text

Duan et al. "Discovering Localized Attributes for Fine-Grained Recognition." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2012. doi:10.1109/CVPR.2012.6248089

Markdown

[Duan et al. "Discovering Localized Attributes for Fine-Grained Recognition." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2012.](https://mlanthology.org/cvpr/2012/duan2012cvpr-discovering/) doi:10.1109/CVPR.2012.6248089

BibTeX

@inproceedings{duan2012cvpr-discovering,
  title     = {{Discovering Localized Attributes for Fine-Grained Recognition}},
  author    = {Duan, Kun and Parikh, Devi and Crandall, David J. and Grauman, Kristen},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {2012},
  pages     = {3474-3481},
  doi       = {10.1109/CVPR.2012.6248089},
  url       = {https://mlanthology.org/cvpr/2012/duan2012cvpr-discovering/}
}