ML Anthology

Laser Speckle Photography for Surface Tampering Detection

Yichang Shih, Abe Davis, Samuel W. Hasinoff, Frédo Durand, William T. Freeman
CVPR 2012 pp. 33-40
doi:10.1109/CVPR.2012.6247655 /cvpr/2012/shih2012cvpr-laser/
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Cite

Text

Shih et al. "Laser Speckle Photography for Surface Tampering Detection." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2012. doi:10.1109/CVPR.2012.6247655

Markdown

[Shih et al. "Laser Speckle Photography for Surface Tampering Detection." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2012.](https://mlanthology.org/cvpr/2012/shih2012cvpr-laser/) doi:10.1109/CVPR.2012.6247655

BibTeX

@inproceedings{shih2012cvpr-laser,
  title     = {{Laser Speckle Photography for Surface Tampering Detection}},
  author    = {Shih, Yichang and Davis, Abe and Hasinoff, Samuel W. and Durand, Frédo and Freeman, William T.},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  year      = {2012},
  pages     = {33-40},
  doi       = {10.1109/CVPR.2012.6247655},
  url       = {https://mlanthology.org/cvpr/2012/shih2012cvpr-laser/}
}