Contour-Based Recognition
Abstract
Contour is an important cue for object recognition. In this paper, built upon the concept of torque in image space, we propose a new contour-related feature to detect and describe local contour information in images. There are two components for our proposed feature: One is a contour patch detector for detecting image patches with interesting information of object contour, which we call the Maximal/Minimal Torque Patch (MTP) detector. The other is a contour patch descriptor for characterizing a contour patch by sampling the torque values, which we call the Multi-scale Torque (MST) descriptor. Experiments for object recognition on the Caltech-101 dataset showed that the proposed contour feature outperforms other contour-related features and is on a par with many other types of features. When combing our descriptor with the complementary SIFT descriptor, impressive recognition results are observed.
Cite
Text
Xu et al. "Contour-Based Recognition." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2012. doi:10.1109/CVPR.2012.6248080Markdown
[Xu et al. "Contour-Based Recognition." IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2012.](https://mlanthology.org/cvpr/2012/xu2012cvpr-contour/) doi:10.1109/CVPR.2012.6248080BibTeX
@inproceedings{xu2012cvpr-contour,
title = {{Contour-Based Recognition}},
author = {Xu, Yong and Quan, Yuhui and Zhang, Zhuming and Ji, Hui and Fermüller, Cornelia and Nishigaki, Morimichi and DeMenthon, Daniel},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition},
year = {2012},
pages = {3402-3409},
doi = {10.1109/CVPR.2012.6248080},
url = {https://mlanthology.org/cvpr/2012/xu2012cvpr-contour/}
}