Reflectance Hashing for Material Recognition

Abstract

We introduce a novel method for using reflectance to identify materials. Reflectance offers a unique signature of the material but is challenging to measure and use for recognizing materials due to its high-dimensionality. In this work, one-shot reflectance of a material surface which we refer to as a reflectance disk is capturing using a unique optical camera. The pixel coordinates of these reflectance disks correspond to the surface viewing angles. The reflectance has class-specific stucture and angular gradients computed in this reflectance space reveal the material class. These reflectance disks encode discriminative information for efficient and accurate material recognition. We introduce a framework called reflectance hashing that models the reflectance disks with dictionary learning and binary hashing. We demonstrate the effectiveness of reflectance hashing for material recognition with a number of real-world materials.

Cite

Text

Zhang et al. "Reflectance Hashing for Material Recognition." Conference on Computer Vision and Pattern Recognition, 2015. doi:10.1109/CVPR.2015.7298926

Markdown

[Zhang et al. "Reflectance Hashing for Material Recognition." Conference on Computer Vision and Pattern Recognition, 2015.](https://mlanthology.org/cvpr/2015/zhang2015cvpr-reflectance/) doi:10.1109/CVPR.2015.7298926

BibTeX

@inproceedings{zhang2015cvpr-reflectance,
  title     = {{Reflectance Hashing for Material Recognition}},
  author    = {Zhang, Hang and Dana, Kristin and Nishino, Ko},
  booktitle = {Conference on Computer Vision and Pattern Recognition},
  year      = {2015},
  doi       = {10.1109/CVPR.2015.7298926},
  url       = {https://mlanthology.org/cvpr/2015/zhang2015cvpr-reflectance/}
}