Potential Field Based Deep Metric Learning

Abstract

Deep metric learning (DML) involves training a network to learn a semantically meaningful representation space. Many current approaches mine n-tuples of examples and model interactions within each tuplets. We present a novel, compositional DML model that instead of in tuples, represents the influence of each example (embedding) by a continuous potential field, and superposes the fields to obtain their combined global potential field. We use attractive/repulsive potential fields to represent interactions among embeddings from images of the same/different classes. Contrary to typical learning methods, where mutual influence of samples is proportional to their distance, we enforce reduction in such influence with distance, leading to a decaying field. We show that such decay helps improve performance on real world datasets with large intra-class variations and label noise. Like other proxy-based methods, we also use proxies to succinctly represent sub-populations of examples. We evaluate our method on three standard DML benchmarks- Cars-196, CUB-200-2011, and SOP datasets where it outperforms state-of-the-art baselines.

Cite

Text

Bhatnagar and Ahuja. "Potential Field Based Deep Metric Learning." Conference on Computer Vision and Pattern Recognition, 2025. doi:10.1109/CVPR52734.2025.02379

Markdown

[Bhatnagar and Ahuja. "Potential Field Based Deep Metric Learning." Conference on Computer Vision and Pattern Recognition, 2025.](https://mlanthology.org/cvpr/2025/bhatnagar2025cvpr-potential/) doi:10.1109/CVPR52734.2025.02379

BibTeX

@inproceedings{bhatnagar2025cvpr-potential,
  title     = {{Potential Field Based Deep Metric Learning}},
  author    = {Bhatnagar, Shubhang and Ahuja, Narendra},
  booktitle = {Conference on Computer Vision and Pattern Recognition},
  year      = {2025},
  pages     = {25549-25559},
  doi       = {10.1109/CVPR52734.2025.02379},
  url       = {https://mlanthology.org/cvpr/2025/bhatnagar2025cvpr-potential/}
}