ML Anthology

Higher-Order Wavelet Statistics and Their Application to Digital Forensics

Hany Farid, Siwei Lyu
CVPRW 2003 pp. 94
doi:10.1109/CVPRW.2003.10093 /cvprw/2003/farid2003cvprw-higherorder/
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Cite

Text

Farid and Lyu. "Higher-Order Wavelet Statistics and Their Application to Digital Forensics." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2003. doi:10.1109/CVPRW.2003.10093

Markdown

[Farid and Lyu. "Higher-Order Wavelet Statistics and Their Application to Digital Forensics." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2003.](https://mlanthology.org/cvprw/2003/farid2003cvprw-higherorder/) doi:10.1109/CVPRW.2003.10093

BibTeX

@inproceedings{farid2003cvprw-higherorder,
  title     = {{Higher-Order Wavelet Statistics and Their Application to Digital Forensics}},
  author    = {Farid, Hany and Lyu, Siwei},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
  year      = {2003},
  pages     = {94},
  doi       = {10.1109/CVPRW.2003.10093},
  url       = {https://mlanthology.org/cvprw/2003/farid2003cvprw-higherorder/}
}