ML Anthology

Higher-Order Wavelet Statistics and Their Application to Digital Forensics

Hany Farid, Siwei Lyu
CVPRW 2003 pp. 94
doi:10.1109/CVPRW.2003.10093 /cvprw/2003/farid2003cvprw-higherorder/

Abstract

We describe a statistical model for natural images that is built upon a multi-scale wavelet decomposition. The model consists of first- and higher-order statistics that capture certain statistical regularities of natural images. We show how this model can be useful in several digital forensic applications, specifically in detecting various types of digital tampering.

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Cite

Text

Farid and Lyu. "Higher-Order Wavelet Statistics and Their Application to Digital Forensics." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2003. doi:10.1109/CVPRW.2003.10093

Markdown

[Farid and Lyu. "Higher-Order Wavelet Statistics and Their Application to Digital Forensics." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2003.](https://mlanthology.org/cvprw/2003/farid2003cvprw-higherorder/) doi:10.1109/CVPRW.2003.10093

BibTeX

@inproceedings{farid2003cvprw-higherorder,
  title     = {{Higher-Order Wavelet Statistics and Their Application to Digital Forensics}},
  author    = {Farid, Hany and Lyu, Siwei},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
  year      = {2003},
  pages     = {94},
  doi       = {10.1109/CVPRW.2003.10093},
  url       = {https://mlanthology.org/cvprw/2003/farid2003cvprw-higherorder/}
}