ML Anthology

Full Orientation Invariance and Improved Feature Selectivity of 3D SIFT with Application to Medical Image Analysis

Stéphane Allaire, John J. Kim, Stephen L. Breen, David A. Jaffray, Vladimir Pekar
CVPRW 2008 pp. 1-8
doi:10.1109/CVPRW.2008.4563023 /cvprw/2008/allaire2008cvprw-full/
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Cite

Text

Allaire et al. "Full Orientation Invariance and Improved Feature Selectivity of 3D SIFT with Application to Medical Image Analysis." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2008. doi:10.1109/CVPRW.2008.4563023

Markdown

[Allaire et al. "Full Orientation Invariance and Improved Feature Selectivity of 3D SIFT with Application to Medical Image Analysis." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2008.](https://mlanthology.org/cvprw/2008/allaire2008cvprw-full/) doi:10.1109/CVPRW.2008.4563023

BibTeX

@inproceedings{allaire2008cvprw-full,
  title     = {{Full Orientation Invariance and Improved Feature Selectivity of 3D SIFT with Application to Medical Image Analysis}},
  author    = {Allaire, Stéphane and Kim, John J. and Breen, Stephen L. and Jaffray, David A. and Pekar, Vladimir},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
  year      = {2008},
  pages     = {1-8},
  doi       = {10.1109/CVPRW.2008.4563023},
  url       = {https://mlanthology.org/cvprw/2008/allaire2008cvprw-full/}
}