Mei et al. "Statistical Shape Modelling: How Many Modes Should Be Retained?." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2008. doi:10.1109/CVPRW.2008.4562996
Markdown
[Mei et al. "Statistical Shape Modelling: How Many Modes Should Be Retained?." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2008.](https://mlanthology.org/cvprw/2008/mei2008cvprw-statistical/) doi:10.1109/CVPRW.2008.4562996
BibTeX
@inproceedings{mei2008cvprw-statistical,
title = {{Statistical Shape Modelling: How Many Modes Should Be Retained?}},
author = {Mei, Lin and Figl, Michael and Rueckert, Daniel and Darzi, Ara and Edwards, Philip J.},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
year = {2008},
pages = {1-8},
doi = {10.1109/CVPRW.2008.4562996},
url = {https://mlanthology.org/cvprw/2008/mei2008cvprw-statistical/}
}