High-Quality Scanning Using Time-of-Flight Depth Superresolution

Schuon et al. "High-Quality Scanning Using Time-of-Flight Depth Superresolution." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2008. doi:10.1109/CVPRW.2008.4563171

[Schuon et al. "High-Quality Scanning Using Time-of-Flight Depth Superresolution." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2008.](https://mlanthology.org/cvprw/2008/schuon2008cvprw-highquality/) doi:10.1109/CVPRW.2008.4563171

@inproceedings{schuon2008cvprw-highquality,
  title     = {{High-Quality Scanning Using Time-of-Flight Depth Superresolution}},
  author    = {Schuon, Sebastian and Theobalt, Christian and Davis, James E. and Thrun, Sebastian},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
  year      = {2008},
  pages     = {1-7},
  doi       = {10.1109/CVPRW.2008.4563171},
  url       = {https://mlanthology.org/cvprw/2008/schuon2008cvprw-highquality/}
}