Schmid and Nicolo. "A Method for Selecting and Ranking Quality Metrics for Optimization of Biometric Recognition Systems." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2009. doi:10.1109/CVPRW.2009.5204309
Markdown
[Schmid and Nicolo. "A Method for Selecting and Ranking Quality Metrics for Optimization of Biometric Recognition Systems." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2009.](https://mlanthology.org/cvprw/2009/schmid2009cvprw-method/) doi:10.1109/CVPRW.2009.5204309
BibTeX
@inproceedings{schmid2009cvprw-method,
title = {{A Method for Selecting and Ranking Quality Metrics for Optimization of Biometric Recognition Systems}},
author = {Schmid, Natalia A. and Nicolo, Francesco},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
year = {2009},
pages = {126-133},
doi = {10.1109/CVPRW.2009.5204309},
url = {https://mlanthology.org/cvprw/2009/schmid2009cvprw-method/}
}