ML Anthology

Learning to Segment Using Machine-Learned Penalized Logistic Models

Yong Yue, Hemant D. Tagare
CVPRW 2009 pp. 58-65
doi:10.1109/CVPRW.2009.5204343 /cvprw/2009/yue2009cvprw-learning/
CVPRW Semantic Scholar

Cite

Text

Yue and Tagare. "Learning to Segment Using Machine-Learned Penalized Logistic Models." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2009. doi:10.1109/CVPRW.2009.5204343

Markdown

[Yue and Tagare. "Learning to Segment Using Machine-Learned Penalized Logistic Models." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2009.](https://mlanthology.org/cvprw/2009/yue2009cvprw-learning/) doi:10.1109/CVPRW.2009.5204343

BibTeX

@inproceedings{yue2009cvprw-learning,
  title     = {{Learning to Segment Using Machine-Learned Penalized Logistic Models}},
  author    = {Yue, Yong and Tagare, Hemant D.},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
  year      = {2009},
  pages     = {58-65},
  doi       = {10.1109/CVPRW.2009.5204343},
  url       = {https://mlanthology.org/cvprw/2009/yue2009cvprw-learning/}
}