ML Anthology

An MRF-Based Statistical Deformation Model for Morphological Image Analysis

Jesus J. Caban, Penny Rheingans, Terry S. Yoo
CVPRW 2010 pp. 31-38
doi:10.1109/CVPRW.2010.5543441 /cvprw/2010/caban2010cvprw-mrfbased/
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Cite

Text

Caban et al. "An MRF-Based Statistical Deformation Model for Morphological Image Analysis." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2010. doi:10.1109/CVPRW.2010.5543441

Markdown

[Caban et al. "An MRF-Based Statistical Deformation Model for Morphological Image Analysis." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2010.](https://mlanthology.org/cvprw/2010/caban2010cvprw-mrfbased/) doi:10.1109/CVPRW.2010.5543441

BibTeX

@inproceedings{caban2010cvprw-mrfbased,
  title     = {{An MRF-Based Statistical Deformation Model for Morphological Image Analysis}},
  author    = {Caban, Jesus J. and Rheingans, Penny and Yoo, Terry S.},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
  year      = {2010},
  pages     = {31-38},
  doi       = {10.1109/CVPRW.2010.5543441},
  url       = {https://mlanthology.org/cvprw/2010/caban2010cvprw-mrfbased/}
}