Absolute Phase Mapping for One-Shot Dense Pattern Projection
Abstract
The use of one-shot pattern projection to obtain 3D dense reconstruction constitutes a promising field of research in structured light. Most of the related works presented in the literature are based on the projection of a fringe pattern to extract depth from phase deviation. However, the algorithms employed to unwrap the phase are computationally slow and can fail under certain slopes and occlusions in the object shape. In these lines, a color one-shot dense reconstruction using fringe pattern projection and wavelet decomposition is presented. Moreover, a novel phase unwrapping algorithm is proposed, providing a fast and reliable absolute phase map for depth reconstruction.
Cite
Text
Fernandez et al. "Absolute Phase Mapping for One-Shot Dense Pattern Projection." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2010. doi:10.1109/CVPRW.2010.5543483Markdown
[Fernandez et al. "Absolute Phase Mapping for One-Shot Dense Pattern Projection." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2010.](https://mlanthology.org/cvprw/2010/fernandez2010cvprw-absolute/) doi:10.1109/CVPRW.2010.5543483BibTeX
@inproceedings{fernandez2010cvprw-absolute,
title = {{Absolute Phase Mapping for One-Shot Dense Pattern Projection}},
author = {Fernandez, Sergio and Salvi, Joaquim and Pribanic, Tomislav},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
year = {2010},
pages = {64-71},
doi = {10.1109/CVPRW.2010.5543483},
url = {https://mlanthology.org/cvprw/2010/fernandez2010cvprw-absolute/}
}