ML Anthology

Methodology for Increasing the Measurement Accuracy of Image Features

Michael Majurski, Joe Chalfoun, Steven P. Lund, Peter Bajcsy, Mary Brady
CVPRW 2016 pp. 1399-1407
doi:10.1109/CVPRW.2016.176 /cvprw/2016/majurski2016cvprw-methodology/
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Cite

Text

Majurski et al. "Methodology for Increasing the Measurement Accuracy of Image Features." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2016. doi:10.1109/CVPRW.2016.176

Markdown

[Majurski et al. "Methodology for Increasing the Measurement Accuracy of Image Features." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2016.](https://mlanthology.org/cvprw/2016/majurski2016cvprw-methodology/) doi:10.1109/CVPRW.2016.176

BibTeX

@inproceedings{majurski2016cvprw-methodology,
  title     = {{Methodology for Increasing the Measurement Accuracy of Image Features}},
  author    = {Majurski, Michael and Chalfoun, Joe and Lund, Steven P. and Bajcsy, Peter and Brady, Mary},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
  year      = {2016},
  pages     = {1399-1407},
  doi       = {10.1109/CVPRW.2016.176},
  url       = {https://mlanthology.org/cvprw/2016/majurski2016cvprw-methodology/}
}