Chen et al. "Delving Deep into Coarse-to-Fine Framework for Facial Landmark Localization." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2017. doi:10.1109/CVPRW.2017.260
Markdown
[Chen et al. "Delving Deep into Coarse-to-Fine Framework for Facial Landmark Localization." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2017.](https://mlanthology.org/cvprw/2017/chen2017cvprw-delving/) doi:10.1109/CVPRW.2017.260
BibTeX
@inproceedings{chen2017cvprw-delving,
title = {{Delving Deep into Coarse-to-Fine Framework for Facial Landmark Localization}},
author = {Chen, Xi and Zhou, Erjin and Mo, Yuchen and Liu, Jiancheng and Cao, Zhimin},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
year = {2017},
pages = {2088-2095},
doi = {10.1109/CVPRW.2017.260},
url = {https://mlanthology.org/cvprw/2017/chen2017cvprw-delving/}
}