Monitoring Ethiopian Wheat Fungus with Satellite Imagery and Deep Feature Learning

Pryzant et al. "Monitoring Ethiopian Wheat Fungus with Satellite Imagery and Deep Feature Learning." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2017. doi:10.1109/CVPRW.2017.196

[Pryzant et al. "Monitoring Ethiopian Wheat Fungus with Satellite Imagery and Deep Feature Learning." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2017.](https://mlanthology.org/cvprw/2017/pryzant2017cvprw-monitoring/) doi:10.1109/CVPRW.2017.196

@inproceedings{pryzant2017cvprw-monitoring,
  title     = {{Monitoring Ethiopian Wheat Fungus with Satellite Imagery and Deep Feature Learning}},
  author    = {Pryzant, Reid and Ermon, Stefano and Lobell, David B.},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
  year      = {2017},
  pages     = {1524-1532},
  doi       = {10.1109/CVPRW.2017.196},
  url       = {https://mlanthology.org/cvprw/2017/pryzant2017cvprw-monitoring/}
}