CLEval: Character-Level Evaluation for Text Detection and Recognition Tasks

Abstract

Despite the recent success of text detection and recognition methods, existing evaluation metrics fail to provide a fair and reliable comparison among those methods. In addition, there exists no end-to-end evaluation metric that takes characteristics of OCR tasks into account. Previous end-to-end metric contains cascaded errors from the binary scoring process applied in both detection and recognition tasks. Ignoring partially correct results raises a gap between quantitative and qualitative analysis, and prevents fine-grained assessment. Based on the fact that character is a key element of text, we hereby propose a Character-Level Evaluation metric (CLEval). In CLEval, the instance matching process handles split and merge detection cases, and the scoring process conducts character-level evaluation. By aggregating character-level scores, the CLEval metric provides a fine-grained evaluation of end-to-end results composed of the detection and recognition as well as individual evaluations for each module from the end-performance perspective. We believe that our metrics can play a key role in developing and analyzing state-of-the-art text detection and recognition methods. The evaluation code is publicly available at https://github.com/clovaai/CLEval.

Cite

Text

Baek et al. "CLEval: Character-Level Evaluation for Text Detection and Recognition Tasks." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2020. doi:10.1109/CVPRW50498.2020.00290

Markdown

[Baek et al. "CLEval: Character-Level Evaluation for Text Detection and Recognition Tasks." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2020.](https://mlanthology.org/cvprw/2020/baek2020cvprw-cleval/) doi:10.1109/CVPRW50498.2020.00290

BibTeX

@inproceedings{baek2020cvprw-cleval,
  title     = {{CLEval: Character-Level Evaluation for Text Detection and Recognition Tasks}},
  author    = {Baek, Youngmin and Nam, Daehyun and Park, Sungrae and Lee, Junyeop and Shin, Seung and Baek, Jeonghun and Lee, Chae Young and Lee, Hwalsuk},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
  year      = {2020},
  pages     = {2404-2412},
  doi       = {10.1109/CVPRW50498.2020.00290},
  url       = {https://mlanthology.org/cvprw/2020/baek2020cvprw-cleval/}
}