Divide and Conquer: High-Resolution Industrial Anomaly Detection via Memory Efficient Tiled Ensemble

Rolih et al. "Divide and Conquer: High-Resolution Industrial Anomaly Detection via Memory Efficient Tiled Ensemble." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2024. doi:10.1109/CVPRW63382.2024.00391

[Rolih et al. "Divide and Conquer: High-Resolution Industrial Anomaly Detection via Memory Efficient Tiled Ensemble." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2024.](https://mlanthology.org/cvprw/2024/rolih2024cvprw-divide/) doi:10.1109/CVPRW63382.2024.00391

@inproceedings{rolih2024cvprw-divide,
  title     = {{Divide and Conquer: High-Resolution Industrial Anomaly Detection via Memory Efficient Tiled Ensemble}},
  author    = {Rolih, Blaz and Ameln, Dick and Vaidya, Ashwin and Akcay, Samet},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
  year      = {2024},
  pages     = {3866-3875},
  doi       = {10.1109/CVPRW63382.2024.00391},
  url       = {https://mlanthology.org/cvprw/2024/rolih2024cvprw-divide/}
}