Beyond Academic Benchmarks: Critical Analysis and Best Practices for Visual Industrial Anomaly Detection

Baitieva et al. "Beyond Academic Benchmarks: Critical Analysis and Best Practices for Visual Industrial Anomaly Detection." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2025.

[Baitieva et al. "Beyond Academic Benchmarks: Critical Analysis and Best Practices for Visual Industrial Anomaly Detection." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2025.](https://mlanthology.org/cvprw/2025/baitieva2025cvprw-beyond/)

@inproceedings{baitieva2025cvprw-beyond,
  title     = {{Beyond Academic Benchmarks: Critical Analysis and Best Practices for Visual Industrial Anomaly Detection}},
  author    = {Baitieva, Aimira and Bouaouni, Yacine and Briot, Alexandre and Ameln, Dick and Khalfaoui, Souhaiel and Akcay, Samet},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
  year      = {2025},
  pages     = {4015-4025},
  url       = {https://mlanthology.org/cvprw/2025/baitieva2025cvprw-beyond/}
}