IMC: A Benchmark for Invariant Learning Under Multiple Causes

Kim et al. "IMC: A Benchmark for Invariant Learning Under Multiple Causes." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2025.

[Kim et al. "IMC: A Benchmark for Invariant Learning Under Multiple Causes." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2025.](https://mlanthology.org/cvprw/2025/kim2025cvprw-imc/)

@inproceedings{kim2025cvprw-imc,
  title     = {{IMC: A Benchmark for Invariant Learning Under Multiple Causes}},
  author    = {Kim, Taero and Lee, Seonggyun and Kang, Joonseong and Choi, Youngjun and Yun, Wonsang and Kim, Nicole Hee-Yeon and Chen, Ziyu and Xie, Lexing and Song, Kyungwoo},
  booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
  year      = {2025},
  pages     = {6469-6478},
  url       = {https://mlanthology.org/cvprw/2025/kim2025cvprw-imc/}
}