Mokhtar et al. "Detect, Classify, Act: Categorizing Industrial Anomalies with Multi-Modal Large Language Models." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2025.
Markdown
[Mokhtar et al. "Detect, Classify, Act: Categorizing Industrial Anomalies with Multi-Modal Large Language Models." IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2025.](https://mlanthology.org/cvprw/2025/mokhtar2025cvprw-detect/)
BibTeX
@inproceedings{mokhtar2025cvprw-detect,
title = {{Detect, Classify, Act: Categorizing Industrial Anomalies with Multi-Modal Large Language Models}},
author = {Mokhtar, Sassan and Mousakhan, Arian and Galesso, Silvio and Tayyub, Jawad and Brox, Thomas},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops},
year = {2025},
pages = {4058-4067},
url = {https://mlanthology.org/cvprw/2025/mokhtar2025cvprw-detect/}
}