ML Anthology

Template Guided Visual Inspection

J. Alison Noble, Van-Duc Nguyen, Constantinos Marinos, A. T. Tran, J. Farley, Kristina Hedengren, Joseph L. Mundy
ECCV 1992 pp. 893-901
doi:10.1007/3-540-55426-2_104 /eccv/1992/noble1992eccv-template/

Abstract

In this paper we describe progress toward the development of an X-ray image analysis system for industrial inspection. Here the goal is to check part dimensions and identify geometric flaws against known tolerance specifications. From an image analysis standpoint this poses challenges to devise robust methods to extract low level features; develop deformable parameterized templates; and perform statistical tolerancing tests for geometry verification. We illustrate aspects of our current system and how knowledge of expected object geometry is used to guide the interpretation of geometry from images.

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Cite

Text

Noble et al. "Template Guided Visual Inspection." European Conference on Computer Vision, 1992. doi:10.1007/3-540-55426-2_104

Markdown

[Noble et al. "Template Guided Visual Inspection." European Conference on Computer Vision, 1992.](https://mlanthology.org/eccv/1992/noble1992eccv-template/) doi:10.1007/3-540-55426-2_104

BibTeX

@inproceedings{noble1992eccv-template,
  title     = {{Template Guided Visual Inspection}},
  author    = {Noble, J. Alison and Nguyen, Van-Duc and Marinos, Constantinos and Tran, A. T. and Farley, J. and Hedengren, Kristina and Mundy, Joseph L.},
  booktitle = {European Conference on Computer Vision},
  year      = {1992},
  pages     = {893-901},
  doi       = {10.1007/3-540-55426-2_104},
  url       = {https://mlanthology.org/eccv/1992/noble1992eccv-template/}
}