ML Anthology

Oriented Visibility for Multiview Reconstruction

Victor S. Lempitsky, Yuri Boykov, Denis V. Ivanov
ECCV 2006 pp. 226-238
doi:10.1007/11744078_18 /eccv/2006/lempitsky2006eccv-oriented/

Abstract

Visibility estimation is arguably the most difficult problem in dense 3D reconstruction from multiple arbitrary views. In this paper, we propose a simple new approach to estimating visibility based on position and orientation of local surface patches. Using our concept of oriented visibility , we present a new algorithm for multiview reconstruction based on exact global optimization of surface photoconsistency using graph cuts on a CW-complex. In contrast to many previous methods for 3D reconstruction from arbitrary views, our method does not depend on initialization and is robust to photometrically difficult situations.

PDF ECCV Semantic Scholar

Cite

Text

Lempitsky et al. "Oriented Visibility for Multiview Reconstruction." European Conference on Computer Vision, 2006. doi:10.1007/11744078_18

Markdown

[Lempitsky et al. "Oriented Visibility for Multiview Reconstruction." European Conference on Computer Vision, 2006.](https://mlanthology.org/eccv/2006/lempitsky2006eccv-oriented/) doi:10.1007/11744078_18

BibTeX

@inproceedings{lempitsky2006eccv-oriented,
  title     = {{Oriented Visibility for Multiview Reconstruction}},
  author    = {Lempitsky, Victor S. and Boykov, Yuri and Ivanov, Denis V.},
  booktitle = {European Conference on Computer Vision},
  year      = {2006},
  pages     = {226-238},
  doi       = {10.1007/11744078_18},
  url       = {https://mlanthology.org/eccv/2006/lempitsky2006eccv-oriented/}
}