ML Anthology

A Parameterless Line Segment and Elliptical Arc Detector with Enhanced Ellipse Fitting

Viorica Patraucean, Pierre Gurdjos, Rafael Grompone von Gioi
ECCV 2012 pp. 572-585
doi:10.1007/978-3-642-33709-3_41 /eccv/2012/patraucean2012eccv-parameterless/

Abstract

We propose a combined line segment and elliptical arc detector, which formally guarantees the control of the number of false positives and requires no parameter tuning. The accuracy of the detected elliptical features is improved by using a novel non-iterative ellipse fitting technique, which merges the algebraic distance with the gradient orientation. The performance of the detector is evaluated on computer-generated images and on natural images.

PDF ECCV Semantic Scholar

Cite

Text

Patraucean et al. "A Parameterless Line Segment and Elliptical Arc Detector with Enhanced Ellipse Fitting." European Conference on Computer Vision, 2012. doi:10.1007/978-3-642-33709-3_41

Markdown

[Patraucean et al. "A Parameterless Line Segment and Elliptical Arc Detector with Enhanced Ellipse Fitting." European Conference on Computer Vision, 2012.](https://mlanthology.org/eccv/2012/patraucean2012eccv-parameterless/) doi:10.1007/978-3-642-33709-3_41

BibTeX

@inproceedings{patraucean2012eccv-parameterless,
  title     = {{A Parameterless Line Segment and Elliptical Arc Detector with Enhanced Ellipse Fitting}},
  author    = {Patraucean, Viorica and Gurdjos, Pierre and von Gioi, Rafael Grompone},
  booktitle = {European Conference on Computer Vision},
  year      = {2012},
  pages     = {572-585},
  doi       = {10.1007/978-3-642-33709-3_41},
  url       = {https://mlanthology.org/eccv/2012/patraucean2012eccv-parameterless/}
}