ML Anthology

BTWD: Bag of Tricks for Wheat Detection

Yifan Wu, Ya-Han Hu, Lei Li
ECCVW 2020 pp. 450-460
doi:10.1007/978-3-030-65414-6_31 /eccvw/2020/wu2020eccvw-btwd/
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Cite

Text

Wu et al. "BTWD: Bag of Tricks for Wheat Detection." European Conference on Computer Vision Workshops, 2020. doi:10.1007/978-3-030-65414-6_31

Markdown

[Wu et al. "BTWD: Bag of Tricks for Wheat Detection." European Conference on Computer Vision Workshops, 2020.](https://mlanthology.org/eccvw/2020/wu2020eccvw-btwd/) doi:10.1007/978-3-030-65414-6_31

BibTeX

@inproceedings{wu2020eccvw-btwd,
  title     = {{BTWD: Bag of Tricks for Wheat Detection}},
  author    = {Wu, Yifan and Hu, Ya-Han and Li, Lei},
  booktitle = {European Conference on Computer Vision Workshops},
  year      = {2020},
  pages     = {450-460},
  doi       = {10.1007/978-3-030-65414-6_31},
  url       = {https://mlanthology.org/eccvw/2020/wu2020eccvw-btwd/}
}