Self-Supervised Models Are Strong Industrial Few-Shot Defect Classification Learners

Yang et al. "Self-Supervised Models Are Strong Industrial Few-Shot Defect Classification Learners." European Conference on Computer Vision Workshops, 2024. doi:10.1007/978-3-031-92805-5_20

[Yang et al. "Self-Supervised Models Are Strong Industrial Few-Shot Defect Classification Learners." European Conference on Computer Vision Workshops, 2024.](https://mlanthology.org/eccvw/2024/yang2024eccvw-selfsupervised/) doi:10.1007/978-3-031-92805-5_20

@inproceedings{yang2024eccvw-selfsupervised,
  title     = {{Self-Supervised Models Are Strong Industrial Few-Shot Defect Classification Learners}},
  author    = {Yang, Teng and Gao, Pengcheng and Wang, Jinbao and Tang, Yongliang},
  booktitle = {European Conference on Computer Vision Workshops},
  year      = {2024},
  pages     = {310-327},
  doi       = {10.1007/978-3-031-92805-5_20},
  url       = {https://mlanthology.org/eccvw/2024/yang2024eccvw-selfsupervised/}
}