Suen et al. "Combining Bias and Variance Reduction Techniques for Regression Trees." European Conference on Machine Learning, 2005. doi:10.1007/11564096_76
Markdown
[Suen et al. "Combining Bias and Variance Reduction Techniques for Regression Trees." European Conference on Machine Learning, 2005.](https://mlanthology.org/ecmlpkdd/2005/suen2005ecml-combining/) doi:10.1007/11564096_76
BibTeX
@inproceedings{suen2005ecml-combining,
title = {{Combining Bias and Variance Reduction Techniques for Regression Trees}},
author = {Suen, Yuk Lai and Melville, Prem and Mooney, Raymond J.},
booktitle = {European Conference on Machine Learning},
year = {2005},
pages = {741-749},
doi = {10.1007/11564096_76},
url = {https://mlanthology.org/ecmlpkdd/2005/suen2005ecml-combining/}
}